Defects with Random Functions
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[edit] Defect Type Description
This defect type is intended to cover HPC defects associated with the use of (pseudo-)random number functions. It is currently classified as a sub-type of Side-effect of Parallelization.
Some HPC applications use a pseudo-random number generator as part of computation. Various problems can occur with a pseudo-random number routine when it is called in parallel contexts.
[edit] Entries
Defect descriptions:
[edit] Advice
- Inspect the characteristics of the implementation of the pseudo-random number generator carefully
[edit] Symptom
- Performance degradation
- Degradation of the quality of the pseudo-random sequence
[edit] Other Findings and Contexts
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Pages referring to this entry: Defect Classification Scheme (Mar 06) Defect Classification Scheme (Mar 07) |
