Defects with Random Functions

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[edit] Defect Type Description

This defect type is intended to cover HPC defects associated with the use of (pseudo-)random number functions. It is currently classified as a sub-type of Side-effect of Parallelization.

Some HPC applications use a pseudo-random number generator as part of computation. Various problems can occur with a pseudo-random number routine when it is called in parallel contexts.

[edit] Entries

Defect descriptions:

[edit] Advice

  • Inspect the characteristics of the implementation of the pseudo-random number generator carefully

[edit] Symptom

  • Performance degradation
  • Degradation of the quality of the pseudo-random sequence

[edit] Other Findings and Contexts

Pages referring to this entry: Defect Classification Scheme (Mar 06) Defect Classification Scheme (Mar 07) 

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