Defect Classification Scheme (Mar 06)
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Contents |
[edit] Description of Defect Classification Scheme
This is an updated defect classification scheme developed after getting feedback from the Validation of the Defect Classification Scheme (Jan 06).
[edit] Purpose
Update the scheme in Defect Classification Scheme (Jan 06)
[edit] Entries
| Type | Sub-type | Definition |
| Algorithm | --- | Logical error |
| Side-effect of Parallelization | I/O Defects | Serial constructs can cause correctness and performance defects when accessed in parallel contexts. |
| Defects with Random Functions | ||
| Use of Language Features | --- | Erroneous use of parallel language features |
| Space Decomposition | --- | Incorrect mapping between the problem space and the problem memory space |
| Synchronization | Deadlock | Incorrect/unnecessary synchronization |
| Race | ||
| Performance | Load Balancing | Scalability problem because processors are not working in parallel |
| Scheduling |
[edit] Other Findings and Contexts
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Pages referring to this entry: Defect Classification Scheme (Jan 06) Defect Classification Scheme by Squyres and DeSouza Defect Classification Scheme by UMD (redirect page) Pages referring to this entry: List of Defect Classification Schemes Use case scenario for professors |
